Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T18:44:30.039Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Resolution Chemical-state Mapping and Analysis for Nuclear Safeguards with Microcalorimeter SEM-EDS

Published online by Cambridge University Press:  30 July 2020

Matthew Carpenter ,
Mark Croce ,
Chandler Smith  and
Katrina Koehler
Matthew Carpenter
Affiliation:
Safeguards Science and Technology Nuclear Engineering and Nonproliferation, Los Alamos National Laboratory, Los Alamos, New Mexico, United States
Mark Croce
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico, United States
Chandler Smith
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico, United States
Katrina Koehler
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Characterization of Nuclear Fuels and Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 178 - 179
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Wollman, D.A., Irwin, K.D., Hilton, G.C., Dulcie, L.L., Newbury, D.E., Martinis, J.M., J. Microscopy 188(3), 196–223 (1997), DOI: 10.1046/j.1365-2818.1997.2670824.x10.1046/j.1365-2818.1997.2670824.xCrossRefGoogle Scholar
Gard, J.D., Becker, D.T., Bennett, D.A., Fowler, J.W., Hilton, G.C., Mates, J.A.B., Reintsema, C.D., Schmidt, D.R., Swetz, D.S., Ullom, J.N., Low, J. Temp. Phys. 193, 485–497 (2018), DOI: 10.1007/s10909-018-2012-210.1007/s10909-018-2012-2CrossRefGoogle Scholar
Cantor, R., Croce, M.P., Havrilla, G.J., Carpenter, M.H., McIntosh, K., Hall, J.A., Kozimor, S.A., Naito, H., Rabin, M.W.M.W., Schmidt, D.R., Swetz, D., Ullom, J.N., Microsc. Microanal. 22, 434–435 (2016), DOI:10.1017/S143192761600302010.1017/S1431927616003020CrossRefGoogle Scholar
Newbury, D.E., Ritchie, N.W.M., J. Mater. Sci. 50, 493–518 (2014), DOI:10.1007/s10853-014-8685-210.1007/s10853-014-8685-2CrossRefGoogle Scholar
Kuisma-Kursula, P., X-Ray Spectrom. 29, 111–118 (2000), DOI:10.1002/(SICI)1097-4539(200001/02)29:1< 111::AID-XRS408 >3.0.CO;2-W10.1002/(SICI)1097-4539(200001/02)29:1<111::AID-XRS408>3.0.CO;2-W3.0.CO;2-W>CrossRef3.0.CO;2-W>Google Scholar
Ritchie, N.W.M., NIST DTSA-II software, http://www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.htmlGoogle Scholar
Goldstein, J.I., Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L., Michael, J., Scanning electron microscopy and x-ray microanalysis, Third Edition, 2003. DOI:10.1007/978-1-4615-0215-910.1007/978-1-4615-0215-9CrossRefGoogle Scholar