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High-Contrast Visualization of Anti-Phase Domains and Screw Dislocations in 3C-SiC

Published online by Cambridge University Press:  04 August 2017

Tomoko Borsa ,
Ryan Brow ,
Hannah Robinson  and
Bart Van Zeghbroeck
Tomoko Borsa
Affiliation:
Nanomaterials Characterization Facility, University of Colorado Boulder, Boulder, CO 80309, USA.
Ryan Brow
Affiliation:
Department of Electrical, Computer and Energy Engineering, University of Colorado Boulder, Boulder, CO 80309, USA.
Hannah Robinson
Affiliation:
BASiC 3C, Inc., Longmont, CO 80501, USA.
Bart Van Zeghbroeck
Affiliation:
Nanomaterials Characterization Facility, University of Colorado Boulder, Boulder, CO 80309, USA. Department of Electrical, Computer and Energy Engineering, University of Colorado Boulder, Boulder, CO 80309, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 576 - 577
Copyright
© Microscopy Society of America 2017 

References

[1] Kong, H.S., Glass, J.T. & Davis, R.F. J. Appl. Phys. 64 1988). p. 2672.CrossRefGoogle Scholar
[2] Chaussende, D., et al., Mater. Sci. Forum 457–460 2004). p. 387.CrossRefGoogle Scholar
[3] Xin, B., et al., Appl. Surf. Sci. 357 2015). p. 985.Google Scholar
[4] Picard, Y.N. & Twigg, M.E. J. Appl. Phys. 104 2008). p. 124906.Google Scholar
[5] Deitz, J.I., et al., Microsc. Microanal. 21(Suppl 3 2015). p. 2157.Google Scholar
[6] Yahiro, Y., et al., J. Electron Microsc. 53 2004). p. 571.Google Scholar
[7] Hens, P., et al. MRS Advances (2017) [Published online, https://doi.org/10.1557/adv.2017.20].Google Scholar