Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-26T04:36:56.664Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Imaging of Short-Range Order Materials (Allophane) with Aberration Corrected TEM and Direct Electron Detection

Published online by Cambridge University Press:  04 August 2017

Thomas G. Sharp  and
Shery L.Y. Chang
Thomas G. Sharp
Affiliation:
School of Earth and Space Exploration, Arizona State University, Tempe AZ, USA LeRoy Eyring Center For Solid State Science, Arizona State University, Tempe AZ, USA
Shery L.Y. Chang
Affiliation:
LeRoy Eyring Center For Solid State Science, Arizona State University, Tempe AZ, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2152 - 2153
Copyright
© Microscopy Society of America 2017 

References

[1] Coleman, S. M. U.S. Geological Survey Professional Paper 1246 1981). p. 51.Google Scholar
[2] Michalski, J. R., et al, Icarus 174 2004). p. 161.Google Scholar
[3] Rampe, E. B., et al, Geology 2012). p. 995.Google Scholar