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High Resolution EELS Study of Ge1-ySny and Ge1-x-ySixSny Alloys

Published online by Cambridge University Press:  27 August 2014

Liying Jiang ,
Toshihiro Aoki ,
John Kouvetakis  and
José Menéndez
Liying Jiang
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287, USA
Toshihiro Aoki
Affiliation:
LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe, AZ 85287, USA
John Kouvetakis
Affiliation:
Department of Chemistry and Biochemistry, Arizona State University, Tempe, AZ 85287, USA
José Menéndez
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 520 - 521
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Grzybowski, G., et al., Phys. Rev. B 84 (20), 205307 (2011).Google Scholar
[2] Mathews, J., et al., Appl. Phys. Lett. 97 (22), 221912 (2010).Google Scholar
[3] Trumbore, F. A. J. Electrochem. Soc. 103 (11), 597 (1956).Google Scholar
[4] Xie, J., et al., Appl. Phys. Lett. 95 (18), 181909 (2009).Google Scholar
[5] Jiang, L., et al., Chemistry of Materials, DOI: 10.1021/cm403801b.Google Scholar
[6] The authors acknowedge support from NSF DMR-1309090 and use of facilities in the John M.Cowley center for high resolution electron microscopy at Arizona State University.Google Scholar