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High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations

Published online by Cambridge University Press:  04 August 2017

Shyam Katnagallu ,
Ali Nematollahi ,
Michal Dagan ,
Michael Moody ,
Blazej Grabowski ,
Baptiste Gault ,
Dierk Raabe  and
Jörg Neugebauer
Shyam Katnagallu
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, Düsseldorf, Germany.
Ali Nematollahi
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, Düsseldorf, Germany.
Michal Dagan
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, UK.
Michael Moody
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, UK.
Blazej Grabowski
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, Düsseldorf, Germany.
Baptiste Gault
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, Düsseldorf, Germany.
Dierk Raabe
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, Düsseldorf, Germany.
Jörg Neugebauer
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, Düsseldorf, Germany.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 642 - 643
Copyright
© Microscopy Society of America 2017 

References

[1] Müller Erwin, W Zeitschrift für Physik 131.1 1951). p. 136.Google Scholar
[2] Dagan, M PhD thesis, University of Oxford (2016).Google Scholar
[3] Bonny, G, Grigorev, P & Terentyev, D Journal of Physics: Condensed Matter 26.48 2014.Google Scholar
[4] Moody Michael, P, et al, Microscopy and Microanalysis 17.02 2011). p. 226.Google Scholar