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He-ion Beam Imaging for Accurate Hardware Trojan Detection

Published online by Cambridge University Press:  30 July 2020

Nitin Varshney ,
Haoting Shen ,
Olivia Paradis  and
Navid Asadizanjani
Nitin Varshney
Affiliation:
University of Florida, Gainesville, Florida, United States
Haoting Shen
Affiliation:
University of Nevada, Reno, Nevada, United States
Olivia Paradis
Affiliation:
University of Florida, Gainesville, Florida, United States
Navid Asadizanjani
Affiliation:
University of Florida, Gainesville, Florida, United States

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 188 - 190
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Copyright
Copyright © Microscopy Society of America 2020

References

Tehranipoor, M. and Koushanfar, F., “A survey of hardware trojan taxonomy and detection,” IEEE design & test of computers, vol. 27, no. 1, pp. 10–25,2010.10.1109/MDT.2010.7CrossRefGoogle Scholar
Vashistha, N., Lu, H., Shi, Q., Rahman, M. T., Shen, H., Woodard, D. L., Asadizanjani, N., and Tehranipoor, M., “Trojan scanner: Detecting hardware trojans with rapid SEM imaging combined with image processing and machine learning,” in ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis. ASM International, 2018, p. 256.Google Scholar
Rahman, M. T., Shi, Q., Tajik, S., Shen, H., Woodard, D. L., Tehranipoor, M., and Asadizanjani, N., “Physical inspection & attacks: New frontier in hardwar esecurity,” in2018 IEEE 3rd International Verification and Security Workshop (IVSW). IEEE, 2018, pp. 93–10210.1109/IVSW.2018.8494856CrossRefGoogle Scholar