Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-29T19:47:03.616Z Has data issue: false hasContentIssue false
  • English
  • Français

He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images

Published online by Cambridge University Press:  03 August 2008

S Wight ,
D Meier ,
M Postek ,
A Vladar ,
J Small  and
D Newbury
S Wight
Affiliation:
National Institute of Standards and Technology
D Meier
Affiliation:
National Institute of Standards and Technology
M Postek
Affiliation:
National Institute of Standards and Technology
A Vladar
Affiliation:
National Institute of Standards and Technology
J Small
Affiliation:
National Institute of Standards and Technology
D Newbury
Affiliation:
National Institute of Standards and Technology
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1186 - 1187
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)