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Hardware Engineering for an APT in a TEM Objective Lens

Published online by Cambridge University Press:  30 July 2020

Brian Gorman
Brian Gorman*
Affiliation:
Colorado School of Mines, Golden, Colorado, United States

Abstract

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Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2614 - 2615
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Copyright
Copyright © Microscopy Society of America 2020

References

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