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Grain Analysis of Atomic Force Microscopy Images via Topological Data Analysis
Published online by Cambridge University Press: 30 July 2020
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- Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
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- Copyright
- Copyright © Microscopy Society of America 2020
References
Arai, T. et al. Scientific Reports, 7(1):4054, 2017.10.1038/s41598-017-07837-xCrossRefGoogle Scholar
Connell, S. D., et al. Quantitative Analysis of Structure and Dynamics in AFM Images of Lipid Membranes, chapter 3, pages 29–44. Springer New York, New York, NY, 2019.10.1007/978-1-4939-8894-5_2CrossRefGoogle Scholar
Eaton, P. and West, P.. Atomic Force Microscopy. Oxford University Press, Inc., 2010.10.1093/acprof:oso/9780199570454.001.0001CrossRefGoogle Scholar
Etxeberria, M., et al. Scanning, 37(6):429–437, 2019/12/08 2015.10.1002/sca.21232CrossRefGoogle Scholar
Horcas, I., et al. Review of Scientific Instruments, 78(1):013705, 2019/11/25 2007.10.1063/1.2432410CrossRefGoogle Scholar
Marsh, B. P., et al. Scientific Reports, 8(1):978, 2018.10.1038/s41598-018-19379-xCrossRefGoogle Scholar
Ngo, C. Y., et al. Physical Review B, 74(24):245331–, 12 2006.10.1103/PhysRevB.74.245331CrossRefGoogle Scholar
Owais, A., et al. Journal of Applied Polymer Science, 133(14), 2019/11/26 2016.10.1002/app.43074CrossRefGoogle Scholar
Ramon-Torregrosa, P. J., et al. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 323(1):83–93, 2008.10.1016/j.colsurfa.2007.10.032CrossRefGoogle Scholar
Ruiz, J. E., et al. Ultramicroscopy, 184:234–241, 2018.10.1016/j.ultramic.2017.09.004CrossRefGoogle Scholar
Sebaihi, N et al. 2017 Meas. Sci. Technol. 28 03400610.1088/1361-6501/28/3/034006CrossRefGoogle Scholar
Smith, J., et al. Transactions of the Institute of Metal Finishing, 81:B55–B58, 05 2003.10.1080/00202967.2003.11871499CrossRefGoogle Scholar
Szyszka, A., et al. Ultramicroscopy, 170:77–85, 2016.10.1016/j.ultramic.2016.07.017CrossRefGoogle Scholar
Bendich, P., et al. IEEE Trans. Vis. Comput. Graph. 2010, 16, 1251–1260.10.1109/TVCG.2010.139CrossRefGoogle Scholar
Delgado-Friedrichs, O., et al. IEEETrans. PatternAnal.Mach.Intell. 2015, 37, 654–666.10.1109/TPAMI.2014.2346172CrossRefGoogle Scholar
Carriere, M. et al. Proceedings of the Computer Graphics Forum, Graz, Austria, 6–8 July 2015; Volume 34, pp. 1–12.10.1111/cgf.12692CrossRefGoogle Scholar
Edelsbrunner, H. et al. Persistent homology. American Mathematical Society: Providence, RI, USA, 2008, Volume: 453, pp. 257–282.10.1090/conm/453/08802CrossRefGoogle Scholar
Edelsbrunner, H. et al. Proc. of the European Congress of Mathematics, Krakow, Poland, 2–7 July 2012.Google Scholar
Ghrist, R., Barcodes: The Persistent Topology of Data. Bul. Am. Math. Soc. 2008, 45, 61–75.Google Scholar
Haider, B.. Acta Physica Polonica A, 132:1325–1328, 10 2017.10.12693/APhysPolA.132.1325CrossRefGoogle Scholar
Haider, B.. Nanoscale Research Letters, 12(1):5, 2017.10.1186/s11671-016-1769-yCrossRefGoogle Scholar
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