Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-29T14:10:40.677Z Has data issue: false hasContentIssue false
  • English
  • Français

Focused Ion Beam Sample Preparation of Complex Devices

Published online by Cambridge University Press:  01 August 2005

P E Russell ,
K L Bunker ,
R Garcia ,
T J Stark  and
J P Vitarelli
P E Russell
Affiliation:
North Carolina State University
K L Bunker
Affiliation:
North Carolina State University
R Garcia
Affiliation:
North Carolina State University
T J Stark
Affiliation:
Materials Analytical Services
J P Vitarelli
Affiliation:
Materials Analytical Services

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 88 - 89
Copyright
© 2005 Microscopy Society of America