Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T06:58:11.769Z Has data issue: false hasContentIssue false
  • English
  • Français

Fixturing Options for Atom Probe Tomography

Published online by Cambridge University Press:  30 July 2020

Katherine Rice ,
Yimeng Chen ,
Robert Ulfig  and
Tsuyoshi Onishi
Katherine Rice
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States
Yimeng Chen
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States
Robert Ulfig
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States
Tsuyoshi Onishi
Affiliation:
Hitachi High-Tech Corporation, Tokyo, Tokyo, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2710 - 2711
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Larson, D. J., et al. “Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures.” Nanotechnology 10.1 (1999): 45.10.1088/0957-4484/10/1/010CrossRefGoogle Scholar
Gorman, Brian P., et al. “Hardware and techniques for cross-correlative TEM and atom probe analysis.” Microscopy Today 16.4 (2008): 42–47.10.1017/S1551929500059782CrossRefGoogle Scholar