Hostname: page-component-848d4c4894-2xdlg Total loading time: 0 Render date: 2024-07-02T17:43:36.206Z Has data issue: false hasContentIssue false
  • English
  • Français

First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM

Published online by Cambridge University Press:  01 August 2004

Lawrence F Allard ,
Douglas A Blom ,
Michael A O'Keefe ,
Chris J Kiely ,
D. Ackland ,
M. Watanabe ,
M. Kawasaki ,
T. Kaneyama  and
H. Sawada
Lawrence F Allard
Affiliation:
Oak Ridge National Laboratory, Oak Ridge Tennessee
Douglas A Blom
Affiliation:
Oak Ridge National Laboratory, Oak Ridge Tennessee
Michael A O'Keefe
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California
Chris J Kiely
Affiliation:
Lehigh University, Bettlehem, Pennsylvania
D. Ackland
Affiliation:
Lehigh University, Bettlehem, Pennsylvania
M. Watanabe
Affiliation:
Lehigh University, Bettlehem, Pennsylvania
M. Kawasaki
Affiliation:
JEOL USA, Peabody, Massachussetts
T. Kaneyama
Affiliation:
JEOL, Tokyo, Japan
H. Sawada
Affiliation:
JEOL, Tokyo, Japan
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 110 - 111
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)