Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T16:40:39.389Z Has data issue: false hasContentIssue false
  • English
  • Français

Extract High Resolution 3D Quantitative Elemental Map Using a Combined HAADF-STEM and EDS Tomography

Published online by Cambridge University Press:  30 July 2020

Yu Yuan ,
Nicolas Brodusch ,
Frédéric Voisard ,
Boris Nijikovsky ,
Audrey Moores  and
Raynald Gauvin
Yu Yuan
Affiliation:
McGill University, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
McGill University, Montreal, Quebec, Canada
Frédéric Voisard
Affiliation:
McGill University, Montreal, Quebec, Canada
Boris Nijikovsky
Affiliation:
Facility for Electron Microscopy Research, McGill University, Montreal, Quebec, Canada
Audrey Moores
Affiliation:
McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1854 - 1855
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Pennycook, S. J. and Nellist, P. D.. Scanning transmission electron microscopy: imaging and analysis, Springer Science & Business Media (2011).10.1007/978-1-4419-7200-2CrossRefGoogle Scholar
Zhong, Z, et al. ., Ultramicroscopy 174 (2017), p. 35-45.10.1016/j.ultramic.2016.12.008CrossRefGoogle Scholar
Gauvin, R and Michaud, P, Microscopy and Microanalysis 15 (2009), p. 488-489.10.1017/S1431927609092423CrossRefGoogle Scholar