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Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy

Published online by Cambridge University Press:  30 July 2020

Tim Nunney ,
Paul Mack ,
Robin Simpson ,
Rick Passey ,
Helen Oppong-Mensah  and
Mark Baker
Tim Nunney
Affiliation:
Thermo Fisher Scientific, East Grinstead, England, United Kingdom
Paul Mack
Affiliation:
Thermo Fisher Scientific, East Grinstead, England, United Kingdom
Robin Simpson
Affiliation:
Thermo Fisher Scientific, East Grinstead, England, United Kingdom
Rick Passey
Affiliation:
Thermo Fisher Scientific, Hillsboro, Oregon, United States
Helen Oppong-Mensah
Affiliation:
University of Surrey, Guildford, England, United Kingdom
Mark Baker
Affiliation:
University of Surrey, Guildford, England, United Kingdom

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Featured Multitechnique Methods and Beamline Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1016
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Copyright
Copyright © Microscopy Society of America 2020

References

Abou-Ras, D., Caballero, R., Fischer, C., Kaufmann, C., Lauermann, I., Mainz, R., Kötschau, . . ., I. (2011). Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films. Microscopy and Microanalysis, 17(5), 728–751. doi:10.1017/S1431927611000523CrossRefGoogle ScholarPubMed