Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-04T21:21:10.025Z Has data issue: false hasContentIssue false
  • English
  • Français

Exploration of Doped Semiconductors at the Atomic Scale

Published online by Cambridge University Press:  04 August 2017

Alfonso Rodil ,
Christian Krammel ,
Rianne Plantenga ,
Sebastian Kôlling  and
Paul Koenraad
Alfonso Rodil
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.
Christian Krammel
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.
Rianne Plantenga
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.
Sebastian Kôlling
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.
Paul Koenraad
Affiliation:
Department of Applied Physics & Institute for Photonic Integration, Eindhoven University of Technology, Eindhoven, the Netherlands.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 670 - 671
Copyright
© Microscopy Society of America 2017 

References

[1] Koenraad, P. M. & Flatté, M.E. Nature Materials 10 2011 96.Google Scholar
[2] Koelling, S., et al“Atom-by-Atom Analysis of Semiconductor Nanowires with Parts Per Million Sensitivity” Nano Letters DOI: 10.1021/acs.nanolett.6b03109.Google Scholar