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Epitaxial Growth and Atomic-Scale Investigation of Dielectric Ca1.46Nb1.11Ti1.38O7 Thin Films

Published online by Cambridge University Press:  04 August 2017

Xiao-Wei Jin ,
Yue-Hua Chen ,
Lu Lu ,
Shao-Bo Mi ,
Hong Wang  and
Chun-Lin Jia
Xiao-Wei Jin
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, PR China.
Yue-Hua Chen
Affiliation:
Key Laboratory for Organic Electronics and Information Displays & Institute of Advanced Materials, Nanjing University of Posts & Telecommunications, Nanjing, PR China.
Lu Lu
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, PR China.
Shao-Bo Mi
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, PR China.
Hong Wang
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, PR China. State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, PR China.
Chun-Lin Jia
Affiliation:
The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, PR China. State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, PR China. Peter Grünberg Institute and Ernst Ruska Center for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich, Germany.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1658 - 1659
Copyright
© Microscopy Society of America 2017 

References

[1] Le Febvrier, A, et al, ACS Appl. Mater. & Interfaces 4 2012). p. 5227.Google Scholar
[2] Yan, X, et al, Ferroelectr 406 2010). p. 3.Google Scholar
[3] Shao, Z, et al, J. Mater. Chem 22 2012). p. 9806.Google Scholar
[4] Roth, RS, et al, J. Solid State Chem 181 2008). p. 406.Google Scholar
[5] Jin, XW, et al, J. Alloys Compd 676 2016). p. 173.Google Scholar
[6] Jin, XW, et al, Appl. Phys. Lett 109 2016). p. 031904.CrossRefGoogle Scholar
[7] The work was supported by the National Basic Research Program of China (No. 2015CB654903) and the National Natural Science Foundation of China (Nos. 51471169 and 51390472).Google Scholar