Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Ruggles, T.J.
Bomarito, G.F.
Qiu, R.L.
and
Hochhalter, J.D.
2018.
New levels of high angular resolution EBSD performance via inverse compositional Gauss–Newton based digital image correlation.
Ultramicroscopy,
Vol. 195,
Issue. ,
p.
85.
Cazottes, S.
Bechis, A.
Lafond, C.
L’Hôte, G.
Roth, C.
Dreyfus, T.
Steyer, P.
Douillard, T.
and
Langlois, C.
2019.
Toward an automated tool for dislocation density characterization in a scanning electron microscope.
Materials Characterization,
Vol. 158,
Issue. ,
p.
109954.
Vermeij, Tijmen
De Graef, Marc
and
Hoefnagels, Johan
2019.
Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction.
Scripta Materialia,
Vol. 162,
Issue. ,
p.
266.
Singh, Saransh
Lenthe, William C.
and
De Graef, Marc
2019.
Many-beam dynamical scattering simulations for scanning and transmission electron microscopy modalities for 2D and 3D quasicrystals.
Philosophical Magazine,
Vol. 99,
Issue. 14,
p.
1732.
De Graef, M
2020.
A dictionary indexing approach for EBSD.
IOP Conference Series: Materials Science and Engineering,
Vol. 891,
Issue. 1,
p.
012009.
Sørensen, B E
Hjelen, J
Ånes, H W
and
Breivik, T
2020.
Recent features in EBSD, including new trapezoidal correction for multi-mapping.
IOP Conference Series: Materials Science and Engineering,
Vol. 891,
Issue. 1,
p.
012021.
Chesser, I.
Francis, T.
De Graef, M.
and
Holm, E.A.
2020.
Learning the grain boundary manifold: tools for visualizing and fitting grain boundary properties.
Acta Materialia,
Vol. 195,
Issue. ,
p.
209.
Wang, Fulin
Echlin, McLean
Shin, Jungho
Bammes, Benjamin
Graef, Marc De
Pollock, Tresa
and
Gianola, Daniel
2020.
Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection.
Microscopy and Microanalysis,
Vol. 26,
Issue. S2,
p.
1164.
Ermagan, Roya
Sauzay, Maxime
Mecklenburg, Matthew H.
and
Kassner, Michael E.
2020.
Determination of Long-Range Internal Stresses in Cyclically Deformed Copper Single Crystals Using Convergent Beam Electron Diffraction.
Crystals,
Vol. 10,
Issue. 12,
p.
1071.
Chatain, Dominique
Singh, Saransh
Courtois, Blandine
Silvent, Jérémie
Verzeroli, Elodie
Rohrer, Gregory S.
De Graef, Marc
and
Wynblatt, Paul
2020.
Influence of step structure on preferred orientation relationships of Ag deposited on Ni(111).
Acta Materialia,
Vol. 200,
Issue. ,
p.
287.
Ding, Z.
Pascal, E.
and
De Graef, M.
2020.
Indexing of electron back-scatter diffraction patterns using a convolutional neural network.
Acta Materialia,
Vol. 199,
Issue. ,
p.
370.
Shi, Qiwei
Zhou, Ying
Zhong, Hongru
Loisnard, Dominique
Dan, Chengyi
Zhang, Fengguo
Chen, Zhe
Wang, Haowei
and
Roux, Stéphane
2021.
Indexation of electron diffraction patterns at grain boundaries.
Materials Characterization,
Vol. 182,
Issue. ,
p.
111553.
Lenthe, William
Pang, Edward
Roach, Michael
Griggs, Jason
Wright, Stuart
and
Nowell, Matthew
2021.
Real World Application of EBSD Forward Models.
Microscopy and Microanalysis,
Vol. 27,
Issue. S1,
p.
40.
Madsen, Jacob
and
Susi, Toma
2021.
The abTEM code: transmission electron microscopy from first principles.
Open Research Europe,
Vol. 1,
Issue. ,
p.
24.
Ernould, Clément
Beausir, Benoît
Fundenberger, Jean-Jacques
Taupin, Vincent
and
Bouzy, Emmanuel
2021.
Integrated correction of optical distortions for global HR-EBSD techniques.
Ultramicroscopy,
Vol. 221,
Issue. ,
p.
113158.
Madsen, Jacob
and
Susi, Toma
2021.
The abTEM code: transmission electron microscopy from first principles.
Open Research Europe,
Vol. 1,
Issue. ,
p.
24.
Ede, Jeffrey M
2021.
Deep learning in electron microscopy.
Machine Learning: Science and Technology,
Vol. 2,
Issue. 1,
p.
011004.
Francis, Toby
Rottmann, Paul F.
Polonsky, Andrew T.
Charpagne, Marie-Agathe
Echlin, McLean P.
Anghel, Veronica
Jones, David R.
Gray, George T.
De Graef, Marc
and
Pollock, Tresa M.
2021.
Multimodal 3D characterization of voids in shock-loaded tantalum: Implications for ductile spallation mechanisms.
Acta Materialia,
Vol. 215,
Issue. ,
p.
117057.
Shi, Qiwei
Loisnard, Dominique
Dan, Chengyi
Zhang, Fengguo
Zhong, Hongru
Li, Han
Li, Yuda
Chen, Zhe
Wang, Haowei
and
Roux, Stéphane
2021.
Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation.
Materials Characterization,
Vol. 178,
Issue. ,
p.
111206.
Sparks, Gregory
Shade, Paul A.
Uchic, Michael D.
Niezgoda, Stephen R.
Mills, Michael J.
and
Obstalecki, Mark
2021.
High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patterns.
Ultramicroscopy,
Vol. 222,
Issue. ,
p.
113187.