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Electron Microscopy Characterization of Ni-Cr-B-Si-C Laser Deposited Coatings

Published online by Cambridge University Press:  25 January 2013

I. Hemmati
Affiliation:
Materials innovation institute (M2i), Department of Applied Physics, University of Groningen, Nijenborgh 4, Groningen 9474 AG, The Netherlands
J.C. Rao
Affiliation:
Materials innovation institute (M2i), Department of Applied Physics, University of Groningen, Nijenborgh 4, Groningen 9474 AG, The Netherlands
V. Ocelík*
Affiliation:
Materials innovation institute (M2i), Department of Applied Physics, University of Groningen, Nijenborgh 4, Groningen 9474 AG, The Netherlands
J.Th.M. De Hosson
Affiliation:
Materials innovation institute (M2i), Department of Applied Physics, University of Groningen, Nijenborgh 4, Groningen 9474 AG, The Netherlands
*
*Corresponding author. E-mail: [email protected]
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Abstract

During laser deposition of Ni-Cr-B-Si-C alloys with high amounts of Cr and B, various microstructures and phases can be generated from the same chemical composition that results in heterogeneous properties in the clad layer. In this study, the microstructure and phase constitution of a high-alloy Ni-Cr-B-Si-C coating deposited by laser cladding were analyzed by a combination of several microscopy characterization techniques including scanning electron microscopy in secondary and backscatter imaging modes, energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and transmission electron microscopy (TEM). The combination of EDS and EBSD allowed unequivocal identification of micron-sized precipitates as polycrystalline orthorhombic CrB, single crystal tetragonal Cr5B3, and single crystal hexagonal Cr7C3. In addition, TEM characterization showed various equilibrium and metastable Ni-B, Ni-Si, and Ni-Si-B eutectic products in the alloy matrix. The findings of this study can be used to explain the phase formation reactions and to tune the microstructure of Ni-Cr-B-Si-C coatings to obtain the desired properties.

Type
Materials Applications
Copyright
Copyright © Microscopy Society of America 2013

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