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Electron Energy Loss Spectroscopy of Vanadium Tetracyanoethylene

Published online by Cambridge University Press:  30 July 2020

Amanda Trout
Affiliation:
The Ohio State University/Center for Electron Microscopy and Analysis, Dublin, Ohio, United States
Seth Kurfman
Affiliation:
The Ohio State University, Columbus, Ohio, United States
Michael Chilcote
Affiliation:
The Ohio State University, Columbus, Ohio, United States
Ezekiel Johnston-Halperin
Affiliation:
The Ohio State University, Columbus, Ohio, United States
David McComb
Affiliation:
Center for Electron Microscopy and Analysis/ Department of Material Science and Engineering, The Ohio State University, Columbus, Ohio, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Copyright
Copyright © Microscopy Society of America 2020

References

Matsuura, H. et al. . J. Phys. Soc. Jpn. 79 , 034712 (2010).Google Scholar
Haskel, D. et al. . Physical Review B 70, 054422 (2004).10.1103/PhysRevB.70.054422CrossRefGoogle Scholar
Kortright, J. B. et al. . Physical Review Letters 100, 257204 (2008).10.1103/PhysRevLett.100.257204CrossRefGoogle Scholar
Lu, Y. et al. . J. Mater. Chem. C. 3 , 7363 (2015).Google Scholar
Pokhodnya, K. I. et al. . Advanced Materials 6 , 12 (2000).Google Scholar
Tate, M. et al. . Microscopy and Microanalysis 22, 237-249 (2016).10.1017/S1431927615015664CrossRefGoogle Scholar