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Electron Energy Loss Near Edge Structures as a Tool to Elucidate Natural and Artificial Minerals Structures

Published online by Cambridge University Press:  04 August 2017

Teresa Dennenwaldt ,
Farhang Nabiei ,
Duncan Alexander ,
James Badro ,
Philippe Gillet ,
Hélène Piet  and
Cécile Hébert
Teresa Dennenwaldt
Affiliation:
Interdisciplinary Center for Electron Microscopy (CIME), Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland Electron Spectrometry and Microscopy Laboratory (LSME), Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
Farhang Nabiei
Affiliation:
Interdisciplinary Center for Electron Microscopy (CIME), Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland Earth and Planetary Science Laboratory (EPSL), Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
Duncan Alexander
Affiliation:
Interdisciplinary Center for Electron Microscopy (CIME), Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
James Badro
Affiliation:
Earth and Planetary Science Laboratory (EPSL), Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland Institut de Physique du Globe de Paris, Sorbonne Paris Cité, Paris, France
Philippe Gillet
Affiliation:
Earth and Planetary Science Laboratory (EPSL), Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
Hélène Piet
Affiliation:
Earth and Planetary Science Laboratory (EPSL), Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland Current address: School of Earth and Space Exploration, Arizona State University, Tempe, AZ , USA
Cécile Hébert
Affiliation:
Interdisciplinary Center for Electron Microscopy (CIME), Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland Electron Spectrometry and Microscopy Laboratory (LSME), Institute of Physics, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2154 - 2155
Copyright
© Microscopy Society of America 2017 

References

[1] Jenniskens, P, et al, Nature 458 2009). p. 485.Google Scholar
[2] Badro, J, et al, , Science 300 (2003) ( p. 789.Google Scholar
[3] Prescher, C, et al, Earth and Planetary Science Letters 399 2014). p. 86.Google Scholar
[4] Piet, H, et al, Proceedings of the National Academy of Sciences 113 2016). p. 11127.Google Scholar