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Edge Sharpening for Unbiased Edge Detection in Field Emission Scanning Electron Microscope Images

Published online by Cambridge University Press:  31 July 2002

P. Markondeya Raj ,
Stanley M. Dunn  and
W. Roger Cannon
P. Markondeya Raj
Affiliation:
Center for Ceramic Research, Rutgers, The State University of New Jersey
Stanley M. Dunn
Affiliation:
Department of Biomedical Engineering, Rutgers, The State University of New Jersey
W. Roger Cannon
Affiliation:
Center for Ceramic Research, Rutgers, The State University of New Jersey
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Abstract

We report here a specific type of edge strength anisotropy observed in field emission scanning electron microscope (FESEM) images. The images show weaker edge gradients in the scanning direction and hence these edges frequently go undetected. Direct application of edge detection algorithms to images with nondistinct edges, such as powder particles, show strong bias to edges perpendicular to the scanning direction. Edge orientation polarograms obtained from these images always show strong fictitious particle orientation in the scanning direction. In this work, we discuss an edge-sharpening algorithm that corrects for this bias and results in relatively more accurate and consistent edge orientation information.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 5 , Issue 2 , March 1999 , pp. 136 - 146
Copyright
© 1999 Microscopy Society of America

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