Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T17:22:49.280Z Has data issue: false hasContentIssue false

EBSD Pattern Quality and its Use in Evaluating Sample Surface Condition

Published online by Cambridge University Press:  01 August 2010

SD Sitzman
Affiliation:
Oxford Instruments America
G Nolze
Affiliation:
Bruker AXS Microanalysis GmbH, Germany
MM Nowell
Affiliation:
EDAX-TSL

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010