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Development of Quantitative Techniques with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries.

Published online by Cambridge University Press:  04 August 2017

S. Bessette ,
P. Hovington ,
C. Kim ,
R. Gauvin ,
H. Demers  and
K. Zaghib
S. Bessette
Affiliation:
Hydro-Quebec’s Research Institute, Varennes, Quebec, Canada. Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
P. Hovington
Affiliation:
Hydro-Quebec’s Research Institute, Varennes, Quebec, Canada.
C. Kim
Affiliation:
Hydro-Quebec’s Research Institute, Varennes, Quebec, Canada.
R. Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
H. Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
K. Zaghib
Affiliation:
Hydro-Quebec’s Research Institute, Varennes, Quebec, Canada.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2088 - 2089
Copyright
© Microscopy Society of America 2017 

References

[1] Hovington, P., etal, Scanning Vol. 38 Nov/Dec 2016). pp. 571–578.Google Scholar
[2] Stevie, F. A., et al Surface and Interface Analysis, SIMS proceedings paper, 2014.Google Scholar
[3] Stevie, F.A. Secondary ion mass spectrometry: Applications for depth profiling and surface characterization. New York: Momentum Press 2016.Google Scholar
[4] Wilson, R.G., Stevie, F.A. & Magee, C.W. Secondary ion mass spectrometry. 1.6–10 New York: Wiley 1989.Google Scholar