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Development of Multiple New 120 kV Transmission Electron Microscope Configurations Applicable for a Wide Range of Fields

Published online by Cambridge University Press:  04 August 2017

K. Tamura ,
T. Fujii ,
H. Mise ,
I. Nagaoki ,
K. Kageyama ,
A. Wakui ,
M. Shirai ,
H. Matsumoto ,
M. Konomi  and
T. Yaguchi
K. Tamura
Affiliation:
Electron Microscope System Design 2nd Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.
T. Fujii
Affiliation:
Electron Microscope System Design 2nd Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.
H. Mise
Affiliation:
Electron Microscope Solution Systems Design Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.
I. Nagaoki
Affiliation:
Electron Microscope System Design 2nd Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.
K. Kageyama
Affiliation:
Electron Microscope Solution Systems Design Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.
A. Wakui
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.
M. Shirai
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.
H. Matsumoto
Affiliation:
Application Development Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.
M. Konomi
Affiliation:
Marketing Dept., Hitachi High-Technologies Corporation, Tokyo, JAPAN
T. Yaguchi
Affiliation:
Electron Microscope System Design 2nd Dept., Hitachi High-Technologies Corporation, Ibaraki, JAPAN.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 62 - 63
Copyright
© Microscopy Society of America 2017 

References

[1] Kubo, T., et al, Microsc. Microanal. 19(Suppl 2 2013). p. 1328.CrossRefGoogle Scholar
[2] Kamino, T., et al, Proc. of IMC 18, Prague, Czech Republic (2014) IT-6-P-1552.Google Scholar