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Development of a Stable Low Temperature Sample Holder for the Side-Entry Transmission Electron Microscope

Published online by Cambridge University Press:  22 July 2022

Alexander Reifsnyder  and
David W. McComb
Alexander Reifsnyder*
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
David W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2476
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Copyright
Copyright © Microscopy Society of America 2022

References

“TEM Specimen Holders”, https://www.gatan.com/products/tem-specimen-holders (accessed Feb. 12, 2022).Google Scholar
Goodge, B. H., Bianco, E., Schnitzer, N., Zandbergen, H. W., and Kourkoutis, L. F., “Atomic-Resolution Cryo-STEM Across Continuously Variable Temperatures,” Microsc. Microanal., vol. 26, no. 3, pp. 439–446, Jun. 2020, doi: 10.1017/S1431927620001427.CrossRefGoogle ScholarPubMed
The authors gratefully acknowledge funding from Defense Advanced Research Projects Agency (DARPA) under Grant No. D18AP00008 and the Center for Emergent Materials at The Ohio State University, an NSF MRSEC (DMR-1420451). Dr. R.E Willams, Dr. C.A Wade, and H. Colijn are thanked for their useful discussions and insights pertaining to this work.Google Scholar