Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-26T18:42:53.065Z Has data issue: false hasContentIssue false

Denoising Atomic Resolution Hyperspectral Data with Tensor Singular Value Decomposition

Published online by Cambridge University Press:  30 July 2020

Chenyu Zhang
Affiliation:
University of Wisconsin-Madison, Madison, Wisconsin, United States
Rungang Han
Affiliation:
University of Wisconsin-Madison, Madison, Wisconsin, United States
Anru Zhang
Affiliation:
University of Wisconsin-Madison, Madison, Wisconsin, United States
Paul Voyles
Affiliation:
University of Wisconsin-Madison, Madison, Wisconsin, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Copyright
Copyright © Microscopy Society of America 2020

References

Ophus, C. Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond. Microsc. Microanal. 25, 563582 (2019).10.1017/S1431927619000497CrossRefGoogle ScholarPubMed
Zhang, A. & Xia, D. Tensor SVD: Statistical and Computational Limits. IEEE Trans. Inf. Theory 64, 73117338 (2018).10.1109/TIT.2018.2841377CrossRefGoogle Scholar
Yankovich, A. B. et al. . Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. Nanotechnology 27, 364001 (2016).10.1088/0957-4484/27/36/364001CrossRefGoogle ScholarPubMed
Maggioni, M., Katkovnik, V., Egiazarian, K. & Foi, A. Nonlocal transform-domain filter for volumetric data denoising and reconstruction. IEEE Trans. Image Process. 22, 119133 (2013).10.1109/TIP.2012.2210725CrossRefGoogle ScholarPubMed
This work was supported by the US. Department of Energy, Basic Energy Sciences (DE-FG02-08ER46547).Google Scholar