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A Cryo-FIB Lift-Out Procedure for Cryo-TEM Sample Preparation at Soft-Hard Matter Interfaces

Published online by Cambridge University Press:  23 September 2015

K. Leifer*
Affiliation:
Department of Engineering Sciences, Uppsala University, Box 534, Uppsala, Sweden

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

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[5] We acknowledge funding from the Knut and Alice Wallenberg Stiftelse..Google Scholar