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Correlative Transmission EBSD-APT Analysis of Grain Boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 Based Thin-film Solar Cells

Published online by Cambridge University Press:  04 August 2017

T. Schwarz ,
G. Stechmann ,
B. Gault ,
O. Cojocaru-Miredin ,
P. Choi ,
A. Redinger ,
S. Siebentritt  and
D. Raabe
T. Schwarz
Affiliation:
Max-Planck-Institut fur Eisenforschung GmbH, Dusseldorf, Germany.
G. Stechmann
Affiliation:
Max-Planck-Institut fur Eisenforschung GmbH, Dusseldorf, Germany.
B. Gault
Affiliation:
Max-Planck-Institut fur Eisenforschung GmbH, Dusseldorf, Germany.
O. Cojocaru-Miredin
Affiliation:
Max-Planck-Institut fur Eisenforschung GmbH, Dusseldorf, Germany. RWTH Aachen, I. Physikalisches Institut IA, Aachen, Germany.
P. Choi
Affiliation:
Korea Advanced Institute of Science and Technology, Department of Materials Science and Engineering, Daejeon, Republic of Korea.
A. Redinger
Affiliation:
University of Luxembourg, Laboratory for photovoltaics, Belvaux, Luxembourg.
S. Siebentritt
Affiliation:
University of Luxembourg, Laboratory for photovoltaics, Belvaux, Luxembourg.
D. Raabe
Affiliation:
Max-Planck-Institut fur Eisenforschung GmbH, Dusseldorf, Germany.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 672 - 673
Copyright
© Microscopy Society of America 2017 

References

[1] Green, M., et al, Progress in Photovoltaics: Research and Applications 25 2017 3.Google Scholar
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[5] Yan, Y., et al, Physical Review Letters 99 2007 235504.Google Scholar
[6] Wei, S., Zhang, S. & Zunger, A. Journal of Applied Physics 85 1999 7214.Google Scholar