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Correlative, Multi-scale, Lab-based X-ray Tomography: From Millimeters to Nanometers

Published online by Cambridge University Press:  30 July 2020

Robin White
Affiliation:
Carl Zeiss RMS, Pleasanton, California, United States
Stephen Kelly
Affiliation:
Carl Zeiss RMS, Pleasanton, California, United States

Abstract

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Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Copyright
Copyright © Microscopy Society of America 2020

References

Holzner, C., Feser, M., Vogt, S., Hornberger, B., Baines, S. B., & Jacobsen, C. (2010). Zernike phase contrast in scanning microscopy with X-rays. Nature Physics, 6(11), 88388710.1038/nphys1765CrossRefGoogle ScholarPubMed
Usseglio-viretta, F.L.E., Smith, K (2017) Quantitative Microstructure Characterization of a NMC Electrode. ECS Transactions, 77(11), 1095111810.1149/07711.1095ecstCrossRefGoogle Scholar