Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-09T09:22:10.212Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative, Multi-scale, Lab-based X-ray Tomography: From Millimeters to Nanometers

Published online by Cambridge University Press:  30 July 2020

Robin White  and
Stephen Kelly
Robin White
Affiliation:
Carl Zeiss RMS, Pleasanton, California, United States
Stephen Kelly
Affiliation:
Carl Zeiss RMS, Pleasanton, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1002 - 1003
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

ZEISS Xradia Versa Product Information. https://www.zeiss.com/microscopy/us/products/x-ray-microscopy/zeiss-xradia-610-and-620-versa.html, accessed 23 January, 2020Google Scholar
Holzner, C., Feser, M., Vogt, S., Hornberger, B., Baines, S. B., & Jacobsen, C. (2010). Zernike phase contrast in scanning microscopy with X-rays. Nature Physics, 6(11), 883–88710.1038/nphys1765CrossRefGoogle ScholarPubMed
Usseglio-viretta, F.L.E., Smith, K (2017) Quantitative Microstructure Characterization of a NMC Electrode. ECS Transactions, 77(11), 1095–111810.1149/07711.1095ecstCrossRefGoogle Scholar