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Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation

Published online by Cambridge University Press:  05 August 2019

Alexander Zintler
Affiliation:
Advanced Electron Microscopy, Materials Science, Technische Universität Darmstadt, Germany.
Robert Eilhardt
Affiliation:
Advanced Electron Microscopy, Materials Science, Technische Universität Darmstadt, Germany.
Stefan Petzold
Affiliation:
Advanced Thin Film Technology, Materials Science, Technische Universität Darmstadt, Germany.
Nico Kaiser
Affiliation:
Advanced Thin Film Technology, Materials Science, Technische Universität Darmstadt, Germany.
Sharath Ulhas
Affiliation:
Advanced Thin Film Technology, Materials Science, Technische Universität Darmstadt, Germany.
Lambert Alff
Affiliation:
Advanced Thin Film Technology, Materials Science, Technische Universität Darmstadt, Germany.
Leopoldo Molina-Luna*
Affiliation:
Advanced Electron Microscopy, Materials Science, Technische Universität Darmstadt, Germany.
*
*Corresponding author: [email protected]

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

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[5]Zintler, A et al. , Ultramicroscopy 181 (2017), p. 144.Google Scholar
[6]The authors acknowledge financial support from the Deutsche Forschungsgemeinschaft (DFG) under research grant MO 3010/3-1 and the European Research Council (ERC) ”Horizon 2020” Program under Grant No. 805359-FOXON.Google Scholar