Article contents
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
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- Copyright © Microscopy Society of America 2019
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