Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-26T04:48:52.544Z Has data issue: false hasContentIssue false
  • English
  • Français

Correcting Systematic Energy Deficits in the Laser-pulsed Atom Probe Mass Spectrum of SiO2

Published online by Cambridge University Press:  30 July 2020

Benjamin Caplins ,
Paul Blanchard ,
Ann Chiaramonti ,
David Diercks ,
Luis Miaja-Avila  and
Norman Sanford
Benjamin Caplins
Affiliation:
NIST, Boulder, Colorado, United States
Paul Blanchard
Affiliation:
NIST, Boulder, Colorado, United States
Ann Chiaramonti
Affiliation:
NIST, Boulder, Colorado, United States
David Diercks
Affiliation:
Colorado School of Mines, Golden, Colorado, United States
Luis Miaja-Avila
Affiliation:
NIST, Boulder, Colorado, United States
Norman Sanford
Affiliation:
NIST, Boulder, Colorado, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2880 - 2881
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Gault, B. et al. , Appl. Phys. Lett. 88 (2006), p. 114101.10.1063/1.2186394CrossRefGoogle Scholar
Arnoldi, L. et al. , J. Appl. Phys. 115 (2014), p. 203705.10.1063/1.4879315CrossRefGoogle Scholar
Arnoldi, L. et al. , J. Appl. Phys. 126 (2019), p 045710.10.1063/1.5092459CrossRefGoogle Scholar
Chiaramonti, A. et al. , MRS Adv. 4 (2019), p. 2367.10.1557/adv.2019.296CrossRefGoogle Scholar
This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar