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Conservation of superstructure at Ag/Si(l1l)--R30-Ag Interface observed by UHV-TEM

Published online by Cambridge University Press:  02 July 2020

Y. Oshima ,
S. Sigeki ,
H. Hirayama  and
K. Takayanagi
Y. Oshima
Affiliation:
Department of Material Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226-8502, Japan
S. Sigeki
Affiliation:
Department of Material Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226-8502, Japan
H. Hirayama
Affiliation:
Department of Material Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226-8502, Japan
K. Takayanagi
Affiliation:
Department of Material Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226-8502, Japan
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Extract

A lot of efforts have been devoted to understanding an interfacial structure. But, there are some difficulties about it as follows: An interfacial structure depends on a surface structure of a substrate and its temperature. Also, an interfacial structure is not homogeneous in general because of a lattice mismatch between a substrate and an overlayer thin film.

Ultrahigh vacuum transmission electron microscope (UHV-TEM) is very powerful to observe clean surface and the fabrication during deposition on the surface. Since structural information can be obtained from 10 nm-sized area to a few μm area using TEM, UHVTEM is very appropriate to investigate interfacial structure in detail.

In this study, structure of Ag/Si(111)--R30-Ag interface was observed by UHVTEM. Especially, it is interesting whether the superstructure is conserved at this interface or not. The Si(l11)- as the substrate surface was obtained by Ag 1ML deposition on Si(l11) 7×7 surface at 673 K.

Type
Atomic Structure And Microchemistry Of Interfaces
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 148 - 149
Copyright
Copyright © Microscopy Society of America

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