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Comparison of Principal Component Analysis and Multivariate Curve Resolution-Alternating Least Squares Analysis of XPS Spectral Maps

Published online by Cambridge University Press:  27 August 2014

F. B. Lavoie ,
N. Braidy ,
S. Biais  and
R. Gosselin
F. B. Lavoie
Affiliation:
Department of Chemical and Biotechnological Engineering, Université de Sherbrooke. Sherbrooke, (QC) J1K 2R1Canada
N. Braidy
Affiliation:
Department of Chemical and Biotechnological Engineering, Université de Sherbrooke. Sherbrooke, (QC) J1K 2R1Canada
S. Biais
Affiliation:
Centre de caractérisation des matériaux. Université de Sherbrooke. Sherbrooke, (QC) J 1K 2R1Canada
R. Gosselin
Affiliation:
Department of Chemical and Biotechnological Engineering, Université de Sherbrooke. Sherbrooke, (QC) J1K 2R1Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 658 - 659
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Artyushkova, K. and Fulghum, J.E. (2002) Surface and Interface Analysis, 33(3), 185-195.Google Scholar
[2] Piqueras, S., et al.. (2011) Analytica Chimica Acta, 705(1–2), 182-192.Google Scholar
[3] http://www.eigenvector.com/software/pls_toolbox.htm, accessed February 13th (2014.Google Scholar
[4] Acknowledgments: We are grateful to GREEN-TPV and Université de Sherbrooke for funding this research.Google Scholar