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Comparison of Dislocation Mapping Using Electron Channeling Contrast Imaging and Cross-Correlation Electron Backscattered Diffraction

Published online by Cambridge University Press:  04 August 2017

Bret E. Dunlap ,
Timothy J. Ruggles ,
David T. Fullwood  and
Martin A. Crimp
Bret E. Dunlap
Affiliation:
Michigan State University, Chemical Engineering and Materials Science, East Lansing, MI, USA
Timothy J. Ruggles
Affiliation:
National Institute of Aerospace, Hampton, VA, USA
David T. Fullwood
Affiliation:
Brigham Young University, Mechanical Engineering, Provo, UT, USA
Martin A. Crimp
Affiliation:
Michigan State University, Chemical Engineering and Materials Science, East Lansing, MI, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 546 - 547
Copyright
© Microscopy Society of America 2017 

References

[1] OpenXY, URL: https://github.com/BYU-MicrostructureOfMaterials/OpenXY.Google Scholar
[2] Adams, B. & Kacher, J. Computers, Materials and Continua 14 2009). p. 188.Google Scholar