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Combinatorial Gradient Reference Specimens for Advanced Scanned Probe Microscopy Techniques

Published online by Cambridge University Press:  01 August 2004

Michael J Fasolka ,
Duangrut Julthongpiput ,
Eric J Amis ,
Tinh Nguyen  and
Xiaohong Gu
Michael J Fasolka
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Duangrut Julthongpiput
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Eric J Amis
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Tinh Nguyen
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Xiaohong Gu
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 136 - 137
Copyright
© 2004 Microscopy Society of America

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