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Characterization of Semiconductor Materials Using Electron Holography

Published online by Cambridge University Press:  04 August 2017

Lin Zhou ,
Zhaofeng Gan ,
Myung-Geun Han ,
David J. Smith  and
Martha R. McCartney
Lin Zhou
Affiliation:
Ames Laboratory, Ames, IA 50014, USA
Zhaofeng Gan
Affiliation:
Intel Corporation, Hillsboro, OR 97124, USA
Myung-Geun Han
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973, USA
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287, USA
Martha R. McCartney
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1404 - 1405
Copyright
© Microscopy Society of America 2017 

References

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[1] McCartney, M.R. & Smith, D.J. Annu. Rev. Mater. Sci 37 2007). p 729.Google Scholar
[2] Han, M.-G., etal, IEEE Trans. Electron Devices 54 2007). p 3336.CrossRefGoogle Scholar
[3] Zhou, L., et a.l, Appl. Phys. Lett. 94 2009 121909.Google Scholar
[4] Gan, Z., et al, Nano Lett. 16 2016). p 3748.Google Scholar
[5] The authors acknowledge the use of facilities in the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar