Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T11:14:54.213Z Has data issue: false hasContentIssue false
  • English
  • Français

Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM

Published online by Cambridge University Press:  04 August 2017

Joseph Tessmer ,
Saransh Singh ,
Yoosuf N. Picard  and
Marc DeGraef
Joseph Tessmer
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA
Saransh Singh
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA
Yoosuf N. Picard
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA
Marc DeGraef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 550 - 551
Copyright
© Microscopy Society of America 2017 

References

[1] Singh, S. & De Graef, M. Microscopy and Microanalysis 2017). in press.Google Scholar
[2] Callahan, P. & De Graef, M. Microscopy and Microanalysis 19 2013). p. 1255.CrossRefGoogle Scholar
[3] Picard, Y., et al, Microscopy Today 20.02 2012). p. 12.CrossRefGoogle Scholar
[4] Research supported by an ONR grant, # N00014-16-1-2821. The authors acknowledge use of the Materials Characterization Facility at Carnegie Mellon University supported by grant MCF-677785..Google Scholar