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Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy

Published online by Cambridge University Press:  25 July 2016

D. Isheim ,
J. Coakley ,
A. Radecka ,
D. Dye ,
T.J. Prosa ,
Y. Chen ,
P.A.J. Bagot  and
D.N. Seidman
D. Isheim
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA Center for Atom-Probe Tomography (NUCAPT), Northwestern University, Evanston, IL, USA
J. Coakley
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, England
A. Radecka
Affiliation:
Department of Materials, Imperial College, South Kensington, London, England Rolls Royce Plc, Elton Road, Derby, England
D. Dye
Affiliation:
Department of Materials, Imperial College, South Kensington, London, England
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
Y. Chen
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
P.A.J. Bagot
Affiliation:
Department of Materials, University of Oxford, Oxford, England
D.N. Seidman
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA Center for Atom-Probe Tomography (NUCAPT), Northwestern University, Evanston, IL, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 702 - 703
Copyright
© Microscopy Society of America 2016 

References

[I] Gault, B, et al, “Atom Probe Microscopy”. Springer, NewYork (2012).CrossRefGoogle Scholar
[2] Larson, DJ, et al, “Local Electrode Atom Probe Tomography: A User's Guide”. Springer (2014).Google Scholar
[3] Seidman, DN & Stiller, K MRS Bulletin 34 (2009). p. 717.CrossRefGoogle Scholar
[4] Ceguerra, AV, et al, Acta Crystallographica A68 (2012). p. 547.CrossRefGoogle Scholar
[5] Stephenson, LT, et al, Philosophical Magazine 93(8 (2013). p. 975.CrossRefGoogle Scholar
[6] Miller, MK, et al, Journal of Nuclear Materials 462 (2015). p. 428.CrossRefGoogle Scholar
[7] Prosa, TJ, et al, Proc. of SPIE 9173 (2014). p. 917307–1.Google Scholar
[8] Coakley, J, et al, Journal of Alloys and Compounds 646 (2015). p. 946.CrossRefGoogle Scholar
[9] Boyer, RR & Briggs, RD Journal of Materials Engineering and Performance 14 (2005). p. 681.CrossRefGoogle Scholar
[10] Thompson, K, et al, Ultramicroscopy 107 (2007). (p. 131.CrossRefGoogle Scholar
[11] The LEAP 4000X Si atom-probe tomograph at the NUCAPT facility of Northwestern Universitywas acquired and upgraded with equipment grants from the MRI program (NSF DMR-0420532) and theDURIP program of the Office of Naval Research (N00014-0400798, N00014-0610539, N00014-0910781). NUCAPT received support from the MRSEC program (NSF DMR-1121262) at the MaterialsResearch Center, SHyNE Resource (NSF NNCI-1542205), and the Initiative for Sustainability andEnergy (ISEN) at Northwestern University.Google Scholar