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Atomic-Scale Investigations of Charge-lattice Modulation in a Hole-doped Charge-ordered Ferrite

Published online by Cambridge University Press:  30 July 2020

Shiqing Deng
Affiliation:
University of Science and Technology Beijing, Beijing, Beijing, China (People's Republic)
Lijun Wu
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Hao Cheng
Affiliation:
Xiamen University, Xiamen, Fujian, China (People's Republic)
Jin-Cheng Zheng
Affiliation:
Xiamen University, Xiamen, Fujian, China (People's Republic)
Shaobo Cheng
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Jun Li
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Wenbi Wang
Affiliation:
Fudan University, Shanghai, Shanghai, China (People's Republic)
Jian Shen
Affiliation:
Fudan University, Shanghai, Shanghai, China (People's Republic)
Jing Tao
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Jing Zhu
Affiliation:
Tsinghua University, Beijing, Beijing, China (People's Republic)
Yimei Zhu
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Copyright
Copyright © Microscopy Society of America 2020

References

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The authors acknowledge funding from the U.S. DOE-BES, Materials Sciences and Engineering Division, under Contract No. DESC0012704, Chinese National Natural Science Foundation under Project No. 51390471 and the National 973 Project of China (Project No. 2015CB654902).Google Scholar