Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T13:19:15.054Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Level Structural Modulations at the Negatively Charged Domain Walls in BiFeO3 Films

Published online by Cambridge University Press:  04 August 2017

W. Y. Wang ,
Y. L. Tang ,
Y. L. Zhu ,
Y. B. Xu ,
Y. Liu ,
Y. J. Wang ,
S. Jagadeesh  and
X. L. Ma
W. Y. Wang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
Y. L. Tang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
Y. L. Zhu
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
Y. B. Xu
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
Y. Liu
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
Y. J. Wang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
S. Jagadeesh
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China
X. L. Ma
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang, China School of Materials Science and Engineering, Lanzhou University of Technology, Langongping Road 287, 730050 Lanzhou, China

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1666 - 1667
Copyright
© Microscopy Society of America 2017 

References

[1] He, Q, et al, Phys. Rev. Lett. 108 2012 067203.CrossRefGoogle Scholar
[2] Vasudevan, RK, et al, Nano Lett. 12 2012 P5524.CrossRefGoogle Scholar
[3] Lee, WM, et al, Adv. Mater. 24 2012 OP49.Google Scholar
[4] Li, L, et al, Nano Lett. 13 2013 P5218.Google Scholar
[5] Tang, YL, et al, Science 348 2015 P547.Google Scholar
[6] Wang, WY, et al, Adv. Mater. Interfaces 2015). DOI: 10.1002/admi.201500024.Google Scholar
[7] The authors acknowledge funding from the National Natural Science Foundation of China (No. 51231007, 51571197, 51501194, 51671194 and 51521091), National Basic Research Program of China (2014CB921002), and the Key Research Program of Frontier Sciences CAS (QYZDJ-SSW-JSC010). YL Tang acknowledges the IMR SYNL-T.S. Kê Research Fellowship and the Youth Innovation Promotion Association CAS (No. 2016177).Google Scholar