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Approaches to Phase Imaging in the Electron Microscope
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Direct Phase Imaging with Coherent Electron Beam in TEM
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Orchowski, A., Rau, W.D., and Lichte, H., Phys. Rev. Lett., 74 (1995), pp. 399–402.10.1103/PhysRevLett.74.399CrossRefGoogle Scholar
Tonomura, A., Matsuda, T., Endo, J., Todokoro, H., and Komoda, T., J. Electron Microsc., 28 (1979), pp. 1–11.Google Scholar
McCartney, M.R., Dunin-Borkowski, R.E., and Smith, D.J., Ultramicroscopy, 203 (2019), pp. 105–118.10.1016/j.ultramic.2019.01.008CrossRefGoogle Scholar
Chapman, J.N., McFadyen, I.R., and McVitie, S., IEEE Trans. Mag., 26 (1990), pp. 1506–1511.10.1109/20.104427CrossRefGoogle Scholar
MacLaren, I., et al. , Ultramicroscopy, 154 (2015), pp. 57–63.10.1016/j.ultramic.2015.03.016CrossRefGoogle Scholar
Lohr, M., et al. , Ultramicroscopy, 117 (2012), pp. 7–14.10.1016/j.ultramic.2012.03.020CrossRefGoogle Scholar
Muller-Caspary, K., et al. , Phys. Rev. Lett., 122 (2019), p. 106102.10.1103/PhysRevLett.122.106102CrossRefGoogle Scholar
Schwarzhuber, F., et al. , Ultramicroscopy, 192 (2018), pp. 21–28.10.1016/j.ultramic.2018.05.003CrossRefGoogle Scholar
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