Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T08:51:44.349Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of High Precision STEM Imaging to Structurally Complex Materials

Published online by Cambridge University Press:  04 August 2017

Jie Feng ,
Chenyu Zhang ,
Dan Zhou ,
Zhongnan Xu ,
Dane Morgan  and
Paul M. Voyles
Jie Feng
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Chenyu Zhang
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Dan Zhou
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Zhongnan Xu
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Dane Morgan
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Paul M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 418 - 419
Copyright
© Microscopy Society of America 2017 

References

[1] Yankovich, A. B., et al, Nat. Commun. 5 2014 4155.Google Scholar
[2] Sang, X. & Lebeau, J. M. Ultramicroscopy 138 2014 28.CrossRefGoogle Scholar
[3] Ophus, C., Ciston, J. & Nelson, C. T. Ultramicroscopy 162 2016 1.Google Scholar
[4] Yu, M., et al, ACS Nano 10 2016 4031.Google Scholar
[5] High precision STEM method development and imaging of vacancies was supported by the U.S. Department of Energy (DE-FG02-08ER46547). Reverse structure determination was supported by the U.S. National Science Foundation (DMR-1332851).Google Scholar