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Application of Atom Probe Tomography to Nitride Semiconductors

Published online by Cambridge University Press:  04 August 2017

Rachel A. Oliver ,
Fengzai Tang ,
Samantha E. Bennett ,
Tomas L. Martin ,
Paul A.J. Bagot ,
GDW Smith  and
Michael P. Moody
Rachel A. Oliver
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Fengzai Tang
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Samantha E. Bennett
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Tomas L. Martin
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
Paul A.J. Bagot
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
GDW Smith
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
Michael P. Moody
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 666 - 667
Copyright
© Microscopy Society of America 2017 

References

[1] Narukawa, Y, et al, Appl. Phys. Lett. 70 1997 981.Google Scholar
[2] Smeeton, TM, et al, Appl. Phys. Lett. 83 2003 5419.Google Scholar
[3] Galtrey, MJ, et al, J. Appl. Phys. 104 2008 013524.Google Scholar
[4] Kisielowski, C & Battel, TP Appl. Phys. Lett. 91 2007 176101.Google Scholar
[5] Bennett, SE, et al, Appl. Phys. Lett. 99 2011 021906.Google Scholar
[6] Tang, F., et al, Appl. Phys. Lett. 106 2015 072104.Google Scholar
[7] Schulz, S., et al, Phys. Rev. B 92 2015 235419.CrossRefGoogle Scholar
[8] Tang, F., et al, Microscopy and Microanalysis 21 2015 544.Google Scholar
[9] Bennett, SE, et al, Ultramicroscopy 111 2011 207.Google Scholar
[10] Mazumder, B., et al, Appl. Phys. Lett. 101 2012 091601.Google Scholar
[11] Rigutti, L, et al, Scripta Materialia 2017). In Press. DOI: 10.1016/j.scriptamat.2016.12.034.Google Scholar