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Analyzing Dislocations with Virtual Dark Field Images Reconstructed from Electron Diffraction Patterns

Published online by Cambridge University Press:  27 August 2014

E.F. Rauch  and
M. Véron
E.F. Rauch
Affiliation:
SIMAP Laboratory, CNRS-Grenoble INP, BP 46 101 rue de la Physique, 38402 Saint Martin d’Hères, France
M. Véron
Affiliation:
SIMAP Laboratory, CNRS-Grenoble INP, BP 46 101 rue de la Physique, 38402 Saint Martin d’Hères, France

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1456 - 1457
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Rauch, E.F.and Veron, M J. Mater. Sci. Eng. Tech. 36 (2005) 552–556.Google Scholar
[2] Rauch, E.F., Portillo, J., Nicolopoulos, S., Bultreys, D., Rouvimov, S., Moeck, P Zeitschrift für Kristallographie (2010) Vol. 225, issue 2-3 pp. 103-109.Google Scholar