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Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging

Published online by Cambridge University Press:  04 August 2017

Jason Holm
Jason Holm*
Affiliation:
Applied Chemical and Materials Division, National Institute of Standards and Technology, Boulder, United States.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 558 - 559
Copyright
© Microscopy Society of America 2017 

References

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