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Analysis of Writing Inks by Time-of-Flight Secondary Ion Mass Spectrometry – A Forensic Case Study

Published online by Cambridge University Press:  01 August 2010

A Schnieders ,
AH Lyter  and
N Havercroft
A Schnieders
Affiliation:
Tascon USA, Inc
AH Lyter
Affiliation:
Federal Forensic Associates, Inc
N Havercroft
Affiliation:
ION-TOF USA, Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 390 - 391
Copyright
Copyright © Microscopy Society of America 2010