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Analysis of Mesoporous Iridium Oxide Thin Films by the Combined Methodical Approach SEM/EDS/STRATAGem

Published online by Cambridge University Press:  01 August 2018

Rene Sachsé ,
Andreas Hertwig ,
Ralph Kraehnert  and
Vasile-Dan Hodoroaba
Rene Sachsé
Affiliation:
Technical University of Berlin, Berlin, Germany.
Andreas Hertwig
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Berlin, Germany
Ralph Kraehnert
Affiliation:
Technical University of Berlin, Berlin, Germany.
Vasile-Dan Hodoroaba
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Berlin, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 762 - 763
Copyright
© Microscopy Society of America 2018 

References

[1] Ortel, E, et al, Chem Mater 23 2011) p. 3201.Google Scholar
[2] Ortel, E, et al, Anal Chem 88 2016) ) (p. 7083.Google Scholar
[3] Stratagem version 2.6, SAMx, 4, rue Galilée, 78280 Guyancourt, France.Google Scholar
[4] Rosu, D-M, et al, Appl Surf Sci 421 2017) p. 487.Google Scholar
[5] Hodoroaba, V-D, et al, Surf Interface Anal 44 2012) p. 1459.Google Scholar
[6] This work was funded through the European Metrology Programme for Innovation and Research (EMPIR) Project 16ENG03 Hybrid metrology for thin films in energy applications (HyMET).Google Scholar