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An Image Evaluation System Coupled with Auto-TEM

Published online by Cambridge University Press:  24 July 2003

N. Nakamura ,
Y. Fujiyoshi ,
K. Mitsuoka ,
K. Murata  and
T. Shinkawa
N. Nakamura
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo 196-8558 , Japan
Y. Fujiyoshi
Affiliation:
Kyoto University, Oiwake-cho, Kitashirakawa, Sakyo-ku, Kyoto 606-8502 , Japan Agency of Industrial Science and Technology, 2-41-6, Aomi, Koto-ku, Tokyo 135-0064 , Japan
K. Mitsuoka
Affiliation:
Kyoto University, Oiwake-cho, Kitashirakawa, Sakyo-ku, Kyoto 606-8502 , Japan
K. Murata
Affiliation:
Agency of Industrial Science and Technology, 2-41-6, Aomi, Koto-ku, Tokyo 135-0064 , Japan
T. Shinkawa
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo 196-8558 , Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1038 - 1039
Copyright
Copyright © Microscopy Society of America 2003