Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-27T00:20:57.185Z Has data issue: false hasContentIssue false
  • English
  • Français

Alignment Considerations for Precise Large Area Imaging and EDS Mapping

Published online by Cambridge University Press:  30 July 2020

Shangshang Mu ,
Shawn Wallace  and
Jens Rafaelsen
Shangshang Mu
Affiliation:
EDAX Inc, A Division of Ametek, Materials Analysis Division, Draper, Utah, United States
Shawn Wallace
Affiliation:
EDAX Inc, A Division of Ametek, Materials Analysis Division, Mahwah, New Jersey, United States
Jens Rafaelsen
Affiliation:
EDAX, Fair Lawn, New Jersey, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1260 - 1262
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Kotula, PG, Hlava, PF and Keenan, MR, Microsc. Microanal. 8 (suppl. 2), 2002, p. 1554CDGoogle Scholar