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Advanced 4D STEM Imaging with the pnCCD (S)TEM Camera

Published online by Cambridge University Press:  04 August 2017

Martin Hum
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Martin Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Robert Ritz
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Julia Schmidt
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Heike Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Hao Yang
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Peter Nellist
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Ryusuke Sagawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
Yukihito Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
Henning Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Lothar Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany University of Siegen, Walter-Flex-Strasse 3, 57072 Siegen, Germany

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

References:

[1] Ryll, H., Simson, M., et al A pnCCD-based, fast direct single electron imaging camera for TEM and STEM. Journal of Instrumentation 11 2016.Google Scholar
[2] Schmidt, J., Hartmann, R., et al, Journal of Instrumentation 11 2016.CrossRefGoogle Scholar
[3] Yang, H., Rutte, R.N., et al Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures. Nature Communications 7 2016.CrossRefGoogle ScholarPubMed